Nano-Science Center – University of Copenhagen

11 June 2013

Nano-Science Center

At the Nano-Science Center, we have a large amount of advanced equipment and instruments that can be beneficial for the development of products and processes in industry. Below is an overview of the tools and services that researchers at the Nano-Science Center have access to and to differing extents made available to the industry. Please, contact the researcher directly for information on equipment and opportunities for collaboration.

Technical specifications

  • X-ray photoelectron spectroscopy (XPS), Kratos Axis Ultra instrument: Chemical composition of the surface (10 nm depth) of a sample (Nico Bovet)
  • Low energy electron diffraction (LEED): 2D surface structure of flat sample (Nico Bovet)
  • Quartz Crystal Microbalance with Dissipation QCM-D
  • Spectroscopic ellipsometry
  • X-ray reflectometer
  • Wide field microscope (Olympus) with Metal-halide lamp as excitation source (Tom Vosch)
  • Stage scanning fluorescence confocal microscope (Olympus) (Tom Vosch)
  • Stage scanning Raman microscope (Olympus) (Tom Vosch)
  • Time-correlated single photon counting (Becker-Hickl SPC830) (Tom Vosch)
  • Laser Excitation wavelengths (nm): 375, 458, 470, 488, 496, 514, 543, 561, 633, 690-960 tunable (Tom Vosch)
  • Rotating disk electrode and other electrochemical setups
  • PeakForce Quantum Mechanical Atomic Force Microscopy (QNM-AFM)
  • Decoder instrument for encoded beads (Morten Meldal)
  • Three laser beadsorter (Morten Meldal)
  • SPS Leica, Confocal Fluoresent Microscope (Dimitris Stamou)
  • TIRF Leica, Fluoresent Microscope (Dimitris Stamou)
  • ALV Goniometer, DLS (Dimitris Stamou)
  • Mass spectrometer coupled to electrochemical cell (DEMS)
  • FTIR with ATR cell (electrochemical and non electrochemical measurements possible)
  • BET: Surface area analysis. (Denis Okhrimenko)
  • Atomic force microscopy and spectroscopy: Particles physical properties such as topography, elasticity, hydrophobicity, conductivity and adhesion (Tue Hassenkam)
  • Scanning Electron Microscopy/Focused Ion Beam – combined with Energy Dispersive X-ray: Particle morphology, size, chemical composition, preparation of nanometer thick slices for TEM and creation of 3D tomograms of thin sections (Kim Dalby)
  • X-ray Diffraction: Solid identification and crystal structure study (Henning Osholm Sørensen)
  • Zeta - Streaming Potential: Particle surface charge (Denis Okhrimenko)

Target group
Everyone after agreement

Additional information
Please go to the Nano-Science Center´s homepage for more information